上海凯治电子NAND的测试例子

#ifndef __TEST_H__
#define __TEST_H__
#include"def.h"

#define MAX_NAND_BLOCK 2048  //一共2048块
#define NAND_PAGE_SIZE 2048  //每块main区2k字节=2048
typedef struct nand_id_info   //芯片的ID信息
{
 U8 IDm; //需修改，厂商ID，ATO的厂商ID，9Bh
 U8 IDd; //需修改，设备ID，ATO的设备ID，F1h
 U8 ID3rd;
 U8 ID4th;
 U8 ID5th;
} nand_id_info;

typedef struct bad_block_info //登记坏块
{
  U8 area[MAX_NAND_BLOCK]; //0表示非坏块，1表示坏块
  U32 sum;   //坏块的总数
} bad_block_info;

//NAND 操作指令
#define NAND_CMD_READ_1st             0x00
#define NAND_CMD_READ_2st             0x30
#define NAND_CMD_RANDOM_WRITE         0x85  //随机写
#define NAND_CMD_RANDOM_READ_1st      0x05
#define NAND_CMD_RANDOM_READ_2st      0xe0
#define NAND_CMD_READ_CB_1st          0x00  //