上海凯治电子NAND的测试案例
来源: | 作者:prod301a6 | 发布时间: 2014-06-23 | 2019 次浏览 | 分享到:

NAND里一块内容写进另一块
#define NAND_CMD_READ_CB_2st          0x35
#define NAND_CMD_READ_ID              0x90  
#define NAND_CMD_RES                  0xff  //
复位命令
#define NAND_CMD_WRITE_PAGE_1st       0x80  
#define NAND_CMD_WRITE_PAGE_2st       0x10  
#define NAND_CMD_BLOCK_ERASE_1st      0x60  //
擦除命令
#define NAND_CMD_BLOCK_ERASE_2st      0xd0  
#define NAND_CMD_READ_STATUS          0x70

//NAND
中断向量
#define INT_NFCON 24

//NFCONF HCLK=100MHZ
#define S3C2440_NFCONF_TACLS_init (1<<12)
#define S3C2440_NFCONF_TWRPH0_init (4<<8)
#define S3C2440_NFCONF_TWRPH1_init (0<<4)
#define S3C2440_NFCONF_BusWidth_init (0)
#define S3C2440_NFCONF_init() ( rNFCONF = S3C2440_NFCONF_TACLS_init  |